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The 27th Ion Beam Analysis & 19th Particle-Induced X-ray Emission joint international conferences (IBA•PIXE 2025)

    INTERNATIONAL CONFERENCES Duration: 40 heures August 17 to 22, 2025   SUMMARY DESCRIPTION The International Conference on Ion Beam Analysis (IBA) takes place every second year since 1971 while the International Conference on Particle Induced X-ray Emission (PIXE), started in 1976, became a triennial conference from 1980 to 2013, and is since then a biennial one. Both conferences bring together people from academia, research centers and industry to exchange on new methods for quantitative material analysis using an ion beam, where they share their advances in developing new methods and analysis, in understanding fundamental phenomena, and in developing applications of the methods to answer questions on materials spanning from ancient art to modern technology. The PIXE conference focuses on the methods involving the detection of emitted X-rays while the IBA conference traditionally encompasses the series of techniques where, in general, the detected particle is an atom or the gamma ray from a nuclear reaction. While this means that the problems that can be addressed with the two range of techniques can be different, they are very complementary and share many common features. As a result, the two communities  started, over the last few meetings, to hold joint conferences. The IBA•PIXE 2025, which is held at Université de Montréal, from August 17th to 22nd, 2025, is organized in cooperation with the International Atomic Energy Agency, the Institut Courtois, the International Union of Pure and Applied Physics, the Université de Montréal and its Faculté des arts et des sciences, and the Regroupement Québécois sur les Matériaux de Pointe. An IBA•PIXE School is organized all day on Sunday August 17th. Please select this item at registration. The programme can be found after July 1st at: https://ibapixe.org/programme CONFERENCE TOPICS AI in IBA Fundamental aspects and simulation Technique development Cultural heritage Biological and medical applications Environmental, geological and Martian applications Security and forensics Fusion and nuclear materials IBA•PIXE at the nanoscale Optical and microelectronic materials Batteries and energy applications In situ and in operando IBA REGISTRATION FEES  $651,45 plus tax / full registration $434,01 plus tax / students & postdoc $216,57 plus tax / accompanying person $43,49 plus tax / IBA•PIXE School ADDITIONAL INFORMATION You will have to complete a survey related to the choice of outings as well as your intolerances and allergies. Refund Policy - Full refunds are available until July 17th, 2025. - 50% refunds are available until August 9th, 2025. - No refunds will be provided after August 9th, 2026. Harassment policy All attendees should be able to enjoy the conference and its benefits free of discrimination and harassment, and where they can enjoy an environment which encourages the free expression and exchange of scientific ideas, and is free from all forms of discrimination, harassment, and retaliation. We will name an advisor who will consult with those who have suffered from harassment and who will suggest ways of redressing their problems, and an advisor who will counsel those accused of harassment. The conference organizers may, after due consideration, take such action they deem appropriate, including the exclusion of individuals responsible for those actions. In such case, the participant will not be refunded nor compensated in any way. CONTACT US Mail: praxis@fas.umontreal.ca Phone: 514 343-2328